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Signal Description

78 Datasheet

6.9 TAP Signals

Table 6-29.TAP Signals

Signal Name Description

Direction/Buffer

Type

TCK TCK (Test Clock): Provides the clock input

for the processor Test Bus (also known as

the Test Access Port).

CMOS

TDI TDI (Test Data In): Transfers serial test

data into the processor. TDI provides the

serial input needed for JTAG specification

support.

CMOS

TDO Test Data Output O

CMOS

TDI_M Test Data In for the GPU/Memory core:

Tie TDI_M and TDO_M together on the

motherboard

CMOS

TDO_M Test Data Output from the processor

core: Tie TDO_M and TDI_M together on the

motherboard.

CMOS

TMS TMS (Test Mode Select): A JTAG

specification support signal used by debug

tools.

CMOS

TRST# TRST# (Test Reset) Boundary-Scan test

reset pin

CMOS

TAPPWRGOOD Power good for ITP O

Asynchronous CMOS

1 2 ... 73 74 75 76 77 78 79 80 81 82 83 ... 180 181

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Intel CP80617004803AA Arkusz Danych Strona 78