Intel CM8064401548605 Arkusz Danych Pobierz pdf (Strona 35)

Figure 4. V

CCIN

Static and Transient Tolerance Loadlines

-0.280

-0.260

-0.240

-0.220

-0.200

-0.180

-0.160

-0.140

-0.120

-0.100

-0.080

-0.060

-0.040

-0.020

0.000

0.020

0.040

100

110

120

130

140

150

160

170

180

190

200

210

220

230

VccIN normalized droop (V)

(Offset fom measured sVID)

VccIN load (A)

1.05 mΩ Load Line

VccIN_Max (V)

VccIN_Typ (V)

VccIN_Min (V)

Die Voltage Validation

Overshoot events at the processor must meet the specifications in Table 16 on page

35 when measured across the V

CCIN_SENSE

and V

SS_VCCIN_SENSE

lands. Overshoot

events that are < 10 ns in duration may be ignored. These measurements of

processor die level overshoot should be taken with a 100 MHz bandwidth limited

oscilloscope.

CCIN

Overshoot Specifications

The Intel

Xeon

processor E5-1600 and E5-2600 v3 product families can tolerate

short transient overshoot events where V

CCIN

exceeds the VID voltage when

transitioning from a high-to-low current load condition. This overshoot cannot exceed

VID + V

OS_MAX

is the maximum allowable overshoot above VID). These

specifications apply to the processor die voltage as measured across the V

CCIN_SENSE

and V

SS_VCCIN_SENSE

lands.

Table 16. V

CCIN

Overshoot Specifications

Symbol Parameter Min Max Units Figure Notes

OS_MAX

Magnitude of V

CCIN

overshoot above VID 50 mV Figure 5 on page 36

OS_MAX

Time duration of V

CCIN

overshoot above

CCIN_Max

value at the new lighter load

25 µs Figure 5 on page 36

2.9.2

Electrical Specifications—Intel

Xeon

Processor E5-1600 and E5-2600 v3 Product Families

Intel

Xeon

Processor E5-1600 and E5-2600 v3 Product Families, Volume 1 of 2, Electrical

September 2014 Datasheet

Order No.: 330783-001 35

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